Tip-enhanced Raman spectroscopic imaging of localized defects in carbon nanotubes
نویسندگان
چکیده
We used tip-enhanced Raman spectroscopy to study defect induced D-band Raman scattering in metallic single-walled carbon nanotubes with a spatial resolution of 15 nm. The spatial extent of the D-band signal in the vicinity of localized defects is visualized and found to be about 2 nm only. Using the strong optical fields underneath the tip, we photogenerate localized defects and derive a relation between defect density and resulting D-band intensity. © 2010 American Institute of Physics. doi:10.1063/1.3499752
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تاریخ انتشار 2013